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FRITSCH is a leading specialist in application-oriented laboratory instruments,Laboratory instruments for preparation of samples and for particle size analysis. |
Employees : |
20+ |
Year established : |
1920 |
Business : |
Manufacturer |
FRITSCH. One Step Ahead.
FRITSCH is an internationally respected manufacturer of application-oriented laboratory instruments. Our instruments have been used for decades worldwide for Sample Preparation and Particle Sizing in industry and research laboratories. Trust FRITSCH quality made in Germany, our experience and our service.
FRITSCH is a leading specialist in application-oriented laboratory instruments. Our instruments are used throughout the world for sample preparation and particle size analysis. They are used for fast industrial applications in process control and quality assurance as well as for especially precise technical research applications in industrial and research laboratories.
FRITSCH instruments are used in the areas of sample preparation and particle size analysis. With the three product groups of PULVERISETTE, ANALYSETTE and LABORETTE, FRITSCH is a synonym for competence and efficiency in all aspects of the above areas.
Through worldwide activities, FRITSCH understands the problems encountered the most diverse range of industries and has implemented constructive solutions for these problems. FRITSCH laboratory instruments offer maximum reliability with innovative technology in connection with simple operation. All instruments from FRITSCH bear the CE mark and are manufactured according to the quality standard ISO 9001:2000
| Ball mills Ball mills are the most effective laboratory mills for batch-wise, rapid comminution of medium-hard to very hard samples down to the finest particle sizes. The grinding can take place dry or wet. Grinding sets of many different materials are available. The mills can also be used for mixing and homogenisation.
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| Laser particle sizer ANALYSETTE 22 MicroTec wet dispersion The ANALYSETTE 22 MicroTec differs from the NanoTec only in the smaller measurement range. Since the back-scattering is not detected, the lower measurement limit is 0.1 µm. The upper measurement limit of 600 µm allows for a shortened optical bench and thereby a very compact and cost-efficient design. | |
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